Three-dimensional analysis of micro defect morphologies in cement-based materials using focused ion beam tomography  

作　　者：WAN KeShu SUN Wei TANG ChunKai RONG ZhiDan 

机构地区：[1]Jiangsu Key Laboratory of Construction Materials,Nanjing 211189,China [2]School of Materials Science and Engineering,Southeast University,Nanjing 211189,China

出　　处：《Science China(Technological Sciences)》2012年第6期1539-1544,共6页中国科学(技术科学英文版)

基　　金：sponsored jointly by the foundation of National Basic Research Program of China ("973" Program) (Grant No. 2009CB623203);National Natural Science Foundation of China (Grant No. 51008072);Doctoral Program of Higher Education of China (Grant No.200802861029);SRF for ROCS,SEM

摘　　要：Although there has been much research of cracks of the cement-based materials using optical and electron microscopy two-dimensional (2D) imaging methods, the real three-dimensional (3D) crack shapes have not previously been revealed. Thanks to the focused ion beam (FIB) tomography and the follow-up image processing, two 3D subsurface cracks and a cluster of inner cracks were picked out and discussed in this research. It was found that the subsurface crack (its length is about 15 part, width about 1-5 prn, and opening about 1 ~tm) was much larger than the inner crack (its length and width are about 1-5 pro, opening is from 200 nm to 1 pan), which arose from the sample preparation process. Besides, it was revealed that most of the inner cracks were in the form of clusters.

关 键 词：focused ion beam (FIB) MICROSTRUCTURE CRACK cement-based materials TOMOGRAPHY 

分 类 号：TU528[建筑科学—建筑技术科学]