基于外部RAM的ARM异常程序调试技术  

Debugging Technique for ARM Exception Programs Based on External RAM

作　　者：姚茂群[1,2] 叶汉能[2] 赵武锋[3] 颜佳宁[4] 

机构地区：[1]杭州师范大学钱江学院,浙江杭州310012 [2]杭州师范大学信息科学与工程学院,浙江杭州310036 [3]浙江大学信息与电子工程学系,浙江杭州310027 [4]浙江医学高等专科学校图书信息中心,浙江杭州310053

出　　处：《杭州师范大学学报（自然科学版）》2012年第3期275-279,288,共6页Journal of Hangzhou Normal University(Natural Science Edition)

摘　　要：在阐述ARM中异常处理的基本思想以及基于JTAG进行调试的基本原理的基础上,详细分析了目前各种基于外部RAM的ARM异常程序调试技术的原理和特点.通过对比各种调试技术的适用性和优缺点,结合目前嵌入式系统开发过程中常用的ARM芯片和集成开发工具,提出一种新的在外部RAM中调试含有异常处理代码的ARM程序的调试技术,并通过实验验证了其有效性.Based on the basic ideas of exception handling in ARM and the basic principles of debugging with JTAG,the principles and characteristics of different ARM program debugging techniques,which are based on exteranl RAM and for exception handling,were analysed in the paper.Comparing the applicability as well as merits and faults of various debugging techniques,with the commonly used ARM chips and integrated development tools in embedded system development,a new kind of debugging technique in the external RAM for ARM programs,which have exception handling codes,was proposed,and its effectiveness was verified by means of experiments.

关 键 词：异常处理 JTAG协议 外部RAM ARM体系结构 调试技术 嵌入式系统 

分 类 号：TP391.4[自动化与计算机技术—计算机应用技术]