卫星电子组件高加速寿命试验技术  

HALT technology for satellite electronic components

作　　者：郭秀才[1] 冯伟泉[1] 郑会明[1] 杨力坡[1] 李树鹏[1] 马腾飞[1] 

机构地区：[1]北京卫星环境工程研究所可靠性与环境工程技术重点实验室,北京100094

出　　处：《航天器环境工程》2011年第5期454-458,共5页Spacecraft Environment Engineering

基　　金："十一五"可靠性共性技术预研项目(编号:51319030205)

摘　　要：高加速寿命试验(HALT)是一种高效的可靠性试验。通过高加速应力作用,激发产品潜在缺陷变为故障并进行改进,以达到其在使用中几乎不会出现故障的目的。文章阐述了试验的基本原理、试验剖面和失效分析等等,根据航天产品的特点,给出了应力极限确定步骤和温度控制方法,并将该方法在卫星典型电子组件上进行了应用研究。High Accelerating Life Test（HALT） is a kind of reliability test with high efficiency.It is used to let the potential defects of products quickly develop into failures through a highly accelerated stress action,and thus to find means to avoid those failures,so that there will be almost no failures during the operation.This paper discusses the basic principle of this kind of test,the test profile and the failure analysis,and provides steps for determining the stress limit and the methods for temperature control according to the characteristics of spacecraft products.The applications of this test method in typical satellite electronic components are specially addressed.

关 键 词：高加速寿命试验 步进应力 工作限 破坏限 试验剖面 电路盒 

分 类 号：V416.5[航空宇航科学与技术—航空宇航推进理论与工程]