I_(DDQ)测试方法的研究与实现  

Research and Implementation of I_(DDQ) Test Method

作　　者：吴丹[1] 石坚[1] 周红[1] 

机构地区：[1]武汉数字工程研究所,430074

出　　处：《计算机与数字工程》2000年第2期32-35,共4页Computer & Digital Engineering

摘　　要：I_(DDQ)测试是当前倍受国内外业界人士关注的一种新的CMOS集成电路测试方法和技术。这种测试是在多种输入逻辑条件下测试CMOS电路的静态电源电流参数值,它可以有效地检测出早期失效器件。I_(DDQ)测试的关键技术是测试向量自动生成及高效的测试实现技术。围绕这两大课题,本文提出了一种基于ITS9000测试系统的功能I_(DDQ)测试方法和技术,并在ITS9000上进行了测试试验。实践表明,这种功能I_(DDQ)测试方法,可以自动生成测试向量集和测试程序,测试效率高,测量结果精确,测试操作简便易行。IDDQ measurement is a new test method and technique of CMOS IC. It can effectively isolate and i-dentify the defective devices, which will not survive in the field. The key technique of IDDQ test is that test vectors generate automatically and test implements execute effectively. To resolve these two problems, this paper presents a function IDDQ test method and technique based on ITS9000 MX test system, and some experiments on ITS9000 MX test system are done. The results of experiment show that function IDDQ test method can generate test vectors sets and programs automatically,increase the efficiency of test process,get more precise test results,and predigest test operations.

关 键 词：COMS集成电路 测试方法 IDDQ 

分 类 号：TN432.07[电子电信—微电子学与固体电子学]