激光烧蚀介质薄膜情况下的单光束扫描法  

The Influence of Ablation of Film Materials by Laser on Z-scan Measurement

作　　者：贾振红[1] 李劬[2] 

机构地区：[1]新疆大学电子信息科学系,乌鲁木齐830046 [2]上海交通大学应用物理系,上海200030

出　　处：《量子电子学报》2000年第1期81-84,共4页Chinese Journal of Quantum Electronics

摘　　要：用单光束扫描法研究薄膜材料的非线性光学性质时，如果入射样品的激光功率过大，将会烧蚀薄膜而产生孔洞，虽然其归一化透过率曲线类似于没有烧蚀的情况，但与样品的非线性光学性质无关，因而造成测量结果错误．本文从理论上分析了因孔洞而产生的正透镜或负透镜效应并给出了归一化透过率的表达式．During the measurement of optical nonlinearities of sample in the thill film by Z-scan technique, ablating makes a hole in the thin film if the incidental laser power is too high, that will produce the error to measurement results. We analyze the positive and negative lens effect caused by the hole theoretically and give the expression of normalized transmittance in this condition.

关 键 词：单光束扫描法 薄膜 烧蚀 

分 类 号：O484[理学—固体物理] TN249[理学—物理]