基于IGBT的短路试验开关的仿真研究  

Analysis and Simulation of IGBT Based Switch for Short-Circuit Withstand Test Applications

作　　者：李雷[1] 陈坚[1] 洪尧生 傅正财[1] 

机构地区：[1]上海交通大学电气工程系电力传输与功率变换控制教育部重点实验室,上海200240 [2]厦门宏发电力电器有限公司,福建厦门361021

出　　处：《电气技术》2012年第6期8-12,共5页Electrical Engineering

摘　　要：本文针对抗短路试验中传统机械开关合闸时间分散性较大的情况,提出用IGBT作为试验开关的解决方案。分析了以IGBT模块为基础的全控开关在交流应用中可能出现的电流不平衡问题。Matlab/Simulink仿真验证了串联电阻对并联IGBT模块的均流具有显著效果。IGBT作为无触点式开关,具有开关速度快的特点,应用IGBT作为抗短路试验开关,可以满足相关标准对抗短路试验严格的相位控制和时间要求。As the traditional mechanical switch＇s closing time has a large dispersion in short-circuit test,this paper propose an IGBT switch as a pilot solution.The paper analyzes the possible current imbalance of the full-controlled switch based on the IGBT modules used in the AC circuit.By Matlab/Simulink simulation,it is verified that the series resistance of IGBT modules in parallel has significant effect on reducing the current imbalance.As a non-contact switch,the IGBT has fast switching characteristics,so it can meet the relevant standards＇ phase control and strict time requirements by applying the IGBT switch in short-circuit test.

关 键 词：抗短路试验 IGBT开关 IGBT并联均流 

分 类 号：TN322.8[电子电信—物理电子学] TM564[电气工程—电器]