用半导体激光器测定金属的线胀系数  

Testing Linear Expansivity of Metal by Using the Semiconductor Laser

作　　者：张莉[1] 

机构地区：[1]惠州学院电子科学系,广东惠州516007

出　　处：《惠州学院学报》2012年第3期74-76,共3页Journal of Huizhou University

摘　　要：本文介绍了用半导体激光器测定金属的线胀系数的方法,并给出测量结果。通过实验对比,此方法完全可以代替传统的测量金属线胀系数方法。在实验误差允许的范围内,完全满足实验精度的要求。The paper introduces the way of testing linear expansivity of metal by using the semiconductor laser and gives some result. Through the experimental comparison, the method can replace the traditional method of testing metal linear expansivity. Within experimental error, it can meet therequirements of the experiment precision fully.

关 键 词：半导体激光器 尺度望远镜 线胀系数 

分 类 号：O348.1[理学—固体力学]