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作 者:Ghulam Murtaza Rai Muhammad Azhar Iqbal Yong-bing Xu lain Gordon Will Qasim Mahmood
机构地区:[1]Department of Physics, University of the Punjab, Lahore 54590, Pakistan [2]Spintronics Laboratory, Department of Electronics, The University of York, York Y010 5DD, UK
出 处:《Chinese Journal of Chemical Physics》2012年第3期313-317,373,374,共7页化学物理学报(英文)
摘 要:Holmium doped GaN diluted magnetic semiconductor thin films have been prepared by thermal evaporation technique and subsequent ammonia annealing. X-ray diffraction mea- surements reveal all peaks belong to the purely hexagonal wurtzite structure. Surface mor- phology and composition analysis were carried out by scanning electron microscopy and energy dispersive spectroscopy respectively. The room temperature ferromagnetic proper- ties of Gal-xHoxN (x=0.0, 0.05) films were analyzed using vibrating sample magnetometer at room temperature. Magnetic measurements showed that the undoped films (i.e. GaN) exhibited diamagnetic behavior, while the Ho-doped (Gao.95Hoo.05N) film exhibited a ferro- magnetic behavior.
关 键 词:Diluted magnetic semiconductor Holmium doping X-ray diffraction Scan-ning electron microscopy Room temperature ferromagnetism
分 类 号:TN304.055[电子电信—物理电子学] O482.523[理学—固体物理]
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