Development and prospect of near-field optical measurements and characterizations  

作　　者：Jia WANG Qingyan WANG Mingqian ZHANG 

机构地区：[1]State Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments,Tsinghua University,Beijing 100084,China

出　　处：《Frontiers of Optoelectronics》2012年第2期171-181,共11页光电子前沿（英文版）

基　　金：This research was supported by the National Natural Science Foundation of China （Grant No. 61177089）.

摘　　要：Scanning near-field optical microscopy （SNOM） is an ideal experimental measuring system in nano-optical measurements and characterizations. Besides microscopy with resolution beyond the diffraction limit, spectroscope with nanometer resolution and other instruments with novel performances have been indispensable for researches in nano-optics and nanophotonics. This paper reviews the developing history of near-field optical （NFO） measuring method and foresees its prospects in future. The development of NFO measurements has gone through four stages, including optical imaging with super resolution, near-field spectroscopy, measurements ofnanooptical parameters, and detections of near-field interac- tions. For every stage, research objectives, technological properties and application fields are discussed.Scanning near-field optical microscopy （SNOM） is an ideal experimental measuring system in nano-optical measurements and characterizations. Besides microscopy with resolution beyond the diffraction limit, spectroscope with nanometer resolution and other instruments with novel performances have been indispensable for researches in nano-optics and nanophotonics. This paper reviews the developing history of near-field optical （NFO） measuring method and foresees its prospects in future. The development of NFO measurements has gone through four stages, including optical imaging with super resolution, near-field spectroscopy, measurements ofnanooptical parameters, and detections of near-field interac- tions. For every stage, research objectives, technological properties and application fields are discussed.

关 键 词：scanning near-field optical microscopy（SNOM） near-field optical （NFO） measurement super-resolution imaging near-field spectroscopy nano-optics nanophotonics 

分 类 号：TH742[机械工程—光学工程] O432.2[机械工程—仪器科学与技术]