求解测试集优化问题  

Solving Test Set Optimization Problem

作　　者：付欣[1] 付帅[2] 

机构地区：[1]吉林工商学院,长春130062 [2]东北师范大学人文学院,长春130117

出　　处：《科技通报》2012年第6期96-97,100,共3页Bulletin of Science and Technology

摘　　要：数字电路的测试生成通常是求解一个或一组测试矢量,这些测试矢量能够激活原始故障,并将这些故障效应传递到最终的输出端。测试集优化的基本目标是确定有效的测试矢量,即通过这些测试向量可以区分电路的正常状态与故障状态。目前随着各种智能优化算法的深入研究发展,针对测试集的优化方案也成为了这些智能策略发挥的舞台。the solution to digital circuits test generation is usually one or a set of test vectors, these test vectors can activate the original failure and the effect of these failures is passed to the final output. Basic target is to identify effective test set optimization of test vectors, the adoption of these test vectors can distinguish between the normal state of the circuit and fault status. Now with a variety of in-depth research and development of intelligent optimization algorithm, for the test set optimization programme has become the smart strategy play to the stage.

关 键 词：测试集优化 测试矢量 冗余结构 

分 类 号：TP302.7[自动化与计算机技术—计算机系统结构]