一种新的恒加试验下双参数指数型产品的可靠性分析  

Reliability Analysis for Two-parameter Exponential Unit under Content-stress Accelerated Life Test

作　　者：谭伟[1] 师义民[1] 孙玉东[1] 

机构地区：[1]西北工业大学应用数学研究所,陕西西安710072

出　　处：《数理统计与管理》2012年第4期633-639,共7页Journal of Applied Statistics and Management

基　　金：国家自然科学基金(No.70471057);陕西省教育厅自然科学基金(No.03Jk065)

摘　　要：针对双参数指数型产品,在具有二项移走(即在每个观测时刻产品的移走数服从二项分布)的分组寿命试验下,研究了分组时刻的确定方法,推导出门限参数、寿命参数和移走概率的极大似然估计。进而,讨论了双参数指数型产品在具有二项移走的恒加寿命分组试验下的可靠性分析问题。利用加速寿命方程,给出了双参数指数型产品的可靠性估计。最后给出随机模拟例子验证了结论的正确性。Based on two-parameter exponential grouped life test with binomial removals （The number of samples removed obey the binomial distribution at each observation time）, the paper studied the method to determine the grouped time, derived out and removal probability. Then, under the situation the MLE of threshold parameter, lifetime parameter of constant-stress accelerated grouped life test with binomial removals, by the aid of the accelerated life equation, the paper gave out the reliability estimation of two-parameter exponential unit. Finally, simulation example is given to verify the correctness of the result.

关 键 词：随机二项移走 恒加寿命试验 分组数据 极大似然估计 可靠性分析 

分 类 号：O213.2[理学—概率论与数理统计]