原位高温X衍射实验技术研究  

Study on in situ high temperature X-ray diffraction technique

作　　者：汤云晖[1] 梅燕[1] 

机构地区：[1]北京工业大学材料科学与工程学院,北京100124

出　　处：《实验技术与管理》2012年第6期31-34,38,共5页Experimental Technology and Management

基　　金：北京市教育科学"十一五"规划重点课题(ADA07069);北京工业大学教育教学研究项目(ER2009-C-03);北京工业大学博士科研启动基金资助项目(52009999200705)

摘　　要：原位高温X衍射是一项应用前景广阔的实验技术。该文采用原位高温X衍射实验技术对电气石进行了25～1 000℃的细致研究,实验揭示了电气石在600℃之前后晶胞参数的变化,原因在于F2e+氧化导致晶胞收缩,并精确确定电气石中的F2e+的氧化温度为600℃、电气石脱羟温度为400℃,显示原位高温X衍射技术是一项很有价值的实验技术。此项实验技术的缺点在于kapton(聚酰亚胺)薄膜的阻隔、导致衍射强度较低,为此提出了可能的解决办法。In situ high temperatures X-ray diffraction is an advanced-future technique but it is not widely used in research.Now this technique was used on tourmaline in heating from 25 ℃ to 1 000 ℃.Experimental results show the abrupt drop of unit-cell parameter about 600 ℃,which is due to cell shrinking for oxidation of iron ions.Exact data could be obtained by analysis of cell parameters that oxidation temperature of ferrous ions happened at 600 ℃ and de-hydroxide temperature is at 400 ℃.At the same time,the shortcoming of this technique is strength of diffraction peak low,which is lower than that of common diffraction and a possible suggestion is proposed.

关 键 词：X射线衍射 原位高温 电气石 

分 类 号：TB302.1[一般工业技术—材料科学与工程] O723[理学—晶体学]