用XRF测定氧化铝陶瓷成分  

Determination Elements in Alumina Ceramic by XRF Spectrometry

作　　者：马慧侠[1] 简本成[1] 孟德安[1] 

机构地区：[1]中国铝业股份有限公司郑州研究院,郑州450041

出　　处：《现代技术陶瓷》2012年第2期43-47,共5页Advanced Ceramics

摘　　要：介绍了使用X射线荧光光谱法测定氧化铝陶瓷主次量成分。用熔融玻璃片法制样,此方法简单,迅速,成本低。选用铝土矿GBW07177～GBW07182和GSB04-2606-2010系列标准样品,采用仪器软件SuperQ中提供的飞利浦模式的经验系数(Classic)和基本参数法校正元素间的谱线重叠干扰和基体效应,使用Magix(PW2403)X射线荧光光谱仪对样品中的Al2O3,SiO2,Fe2O3,TiO2,K2O,Na2O,CaO和MgO共8个元素进行测定,各组分的RSD均小于3.36%,测量结果与计算值的误差在化学分析允许差范围内。A method has been developed for the determination of Al2O3 ,SiO2 ,Fe2O3 ,TiO2 , K2O ,Na2O, CaO and MgO in alumina ceramic by An X - ray fluorescence spectrometric Magix （ PW2403 ） with fused glass disk mdthod and GBW07177 -GBW07182 ,GSB 04 -2606 -2010 standard samples . The inter element and matrix effects were corrected by using empirical alpha（or） coefficient program（ Classic）provided by the SuperQ and basic parameters. The RSD＇s obtained were less than 3.5%. The discrepancies between the results obtained by the present method and the calculate values were within the allowable range of chemical analysis.

关 键 词：X射线荧光光谱 经验系数 基本参数法 熔融玻璃片法 氧化铝陶瓷 

分 类 号：TQ174.758[化学工程—陶瓷工业]