基于专利地图的薄膜太阳能领域专利引证分析  

Patent Citation Analysis on Foreign Thin Film Solar Based on Patent Map

作　　者：刘桂锋[1] 王秀红[1] 

机构地区：[1]江苏大学科技信息研究所,江苏镇江212013

出　　处：《科技管理研究》2012年第14期197-201,共5页Science and Technology Management Research

基　　金：镇江市软科学基金项目"产业专利状态分析及预警机制研究(薄膜太阳能)"(RK2010002)

摘　　要：利用Aureka分析软件的专利引证树和专利地图对国外薄膜太阳能领域的专利进行分析,并对日本半导体能源实验室的高被引证专利进行专利引证树分析,得到了被引专利的技术总体分布、技术发展历程、目标公司及竞争对手布局分析。该研究结果可为我国薄膜太阳能领域相关企业制定研发策略、寻求技术发展方向和规避专利侵权风险提供帮助。The paper analyzes high cited patent of Japan semiconductor energy laboratory in the field of thin film solar by Aureka Citation Tree and Aureka Theme Scape. It obtaines a lot of patent information, such as the whole distribution of technology, development trends of technology and patent technologies between companies and other competitors by the ci- tation analysis mentioned above. The result is very helpful to make research and development strategy in seeking the di- rection of technological development and avoid the risk of patent violation for Chinese enterprises.

关 键 词：专利 专利地图 专利引用 薄膜太阳能 

分 类 号：G353[文化科学—情报学]