双侧限“σ”法抽样方案表的设计(以均值为质量质指标)  

The Design of Sample Plan Table(“σ” method)With Double Specification Limit

作　　者：于善奇[1] 

机构地区：[1]北京工业大学,北京100124

出　　处：《标准科学》2012年第7期39-42,共4页Standard Science

摘　　要：本文根据双侧限计量一次抽样检验的理论公式[1],以及文献[2]、[3]中的数值表,给出了双侧限"σ"抽样方案表及其设计原理。该抽样方案表设计先进,操作简便。文末给出了应用示例。The article according to the theoretical formal and numerical table of Single Sampling inspection by variable with double specification limit, Studied out the sample plan table（ ＂σ＂ method） with double specification limit and principle of design. The sample plan table not only has advanced design also simplify operation. At the end of this article gives the application example.

关 键 词：双侧限 计量 抽样方案表 

分 类 号：TB114[理学—概率论与数理统计]