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作 者:王斌[1] 张华 黄伟[1] 冯小军[1] 刘继平[1]
机构地区:[1]东莞出入境检验检疫局,东莞523072 [2]上海思百吉仪器系统有限公司,上海200233
出 处:《理化检验(化学分册)》2012年第7期810-811,共2页Physical Testing and Chemical Analysis(Part B:Chemical Analysis)
摘 要:提出了X射线荧光光谱法测定聚合物材料中铅和镉的方法。将粒径小于4mm的样品颗粒置于样品杯中,保持样品厚度大于16mm,加盖后按仪器工作条件进行测定。铅和镉的线性范围依次在1 033μg.g-1和980μg.g-1以内,检出限依次为0.31μg.g-1和0.69μg.g-1。方法用于分析标准物质(ERM-EC680k和ERM-EC681k),测定值与认定值相符。XRFS determination of lead and cadmium in polymeric materials was proposed in this paper. The sample was crusned to granules having granular diameters less than 4 rnm and transferred into the sample cup, packing the sample granules to a thickness over 16 ram. After covering the sample cup, XRFS determination was performed according to the prescribed instrumental working condition. Linearity ranges of Pb and Cd were kept in the range within1033 μg·g^-1and 980μg·g^-1, with detection limits of 0.31μg·g^-1 and 0.69μg·g^-1 respectively. The proposed method was used in analyzing two standard reference materials (ERM-EC681k and ERM-EC680k), giving results in consistency with the certified values.
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