An SEU-hardened latch with a triple-interlocked structure  

作　　者：李渊清 姚素英 徐江涛 高静 

机构地区：[1]School of Electronic Information Engineering,Tianjin University

出　　处：《Journal of Semiconductors》2012年第8期89-96,共8页半导体学报（英文版）

基　　金：Project supported by the National Natural Science Foundation of China(Nos.61036004,61076024)

摘　　要：A single event upset （SEU） tolerant latch with a triple-interlocked structure is presented. Its self-recovery mechanism is implemented by using three pairs of guard-gates and inverters to construct feedback lines inside the structure. This latch effectively suppresses the effects of charge deposition at any single internal node caused by particle strikes. Three recently reported SEU-hardened latches are chosen and compared with this latch in terms of reliability. The potential problems that these three latches could still get flipped due to single event effects or single event effects plus crosstalk coupling are pointed out, which can be mitigated by this proposed latch. The SEU tolerance of each latch design is evaluated through circuit-level SEU injection simulation. Furthermore, discussions on the crosstalk robustness and some other characteristics of these latches are also presented.A single event upset （SEU） tolerant latch with a triple-interlocked structure is presented. Its self-recovery mechanism is implemented by using three pairs of guard-gates and inverters to construct feedback lines inside the structure. This latch effectively suppresses the effects of charge deposition at any single internal node caused by particle strikes. Three recently reported SEU-hardened latches are chosen and compared with this latch in terms of reliability. The potential problems that these three latches could still get flipped due to single event effects or single event effects plus crosstalk coupling are pointed out, which can be mitigated by this proposed latch. The SEU tolerance of each latch design is evaluated through circuit-level SEU injection simulation. Furthermore, discussions on the crosstalk robustness and some other characteristics of these latches are also presented.

关 键 词：single event upset single event transient LATCH triple-interlocked fault injection CROSSTALK 

分 类 号：TP333[自动化与计算机技术—计算机系统结构]