X-射线荧光光谱测定氧化铍中杂质元素  

X-Ray Fluorescence Spectrometric Determination of Impurity Elements in Beryllium Oxide

作　　者：包生祥[1] 王志红[1] 荣丽梅[1] 刘敬松[1] 郭俊 

机构地区：[1]电子科技大学材料分析中心,成都610054 [2]昆明高新技术开发区,昆明650000

出　　处：《分析化学》2000年第6期756-758,共3页Chinese Journal of Analytical Chemistry

基　　金：国防科工委"九.五"共性研究项目

摘　　要：拟定了BeO中12种痕量杂质元素的X-射线荧光光谱测定方法．采用光谱纯试剂人工合成校准标样，粉末压块法制备分析样片。考虑到BeO对X射线的透明性，在样片与样品盒支架之间垫置钼片消除试样盒发射线的干扰并产生附加激发以提高灵敏度。本文分析结果与等离子发射光谱和原子吸收光谱对照相吻合。X-ray fluorescence spectrometry was applied to the determination of 12 impurity elements in BeO.Calibration standards were manually synthesized from spectral-pure reagents and analytical sample discs were prepared by powder-briqueting.Considering the transparency of BeO to X-ray, a molybdenum pad was laid between the sample disc and the sample supporter of a sample holder to eliminate the interference of spectrum from the sample holder and to produce additional emission for increasing sensitivity.The results analyzed by this method were in good agreement wity those obtained by inductively coupled plasma-atomic emission spectroscopy and atomic absorption spectroscopy.

关 键 词：X-射线荧光光谱 氧化铍 杂质测定 陶瓷 

分 类 号：O657.3[理学—分析化学]