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作 者:R.Masrour M.Hamedoun A.Benyoussef
机构地区:[1]Laboratory of Materials,Processes,Environment and Quality,Cady Ayyed University,National School of Applied Sciences,Safi,Morocco [2]LMPHE(URAC-12),Facult'e des Sciences,Universit'e Mohamed V-Agdal,Rabat,Morocco [3]Institute for Nanomaterials and Nanotechnologies,MAScIr,Rabat,Morocco [4]Academie Hassan II des Sciences et Techniques,Rabat,Morocco
出 处:《Chinese Physics B》2012年第8期487-493,共7页中国物理B(英文版)
摘 要:In this work, the magnetic properties of Ising and XY antiferromagnetic thin-films are investigated each as a function of Neel temperature and thickness for layers (n = 2, 3, 4, 5, 6, and bulk (∞) by means of a mean-field and high temperature series expansion (HTSE) combined with Pade approximant calculations. The scaling law of magnetic susceptibility and magnetization is used to determine the critical exponent γ, veff (mean), ratio of the critical exponents γ/v, and magnetic properties of Ising and XY antiferromagnetic thin-films for different thickness layers n = 2, 3, 4, 5, 6, and bulk (∞).In this work, the magnetic properties of Ising and XY antiferromagnetic thin-films are investigated each as a function of Neel temperature and thickness for layers (n = 2, 3, 4, 5, 6, and bulk (∞) by means of a mean-field and high temperature series expansion (HTSE) combined with Pade approximant calculations. The scaling law of magnetic susceptibility and magnetization is used to determine the critical exponent γ, veff (mean), ratio of the critical exponents γ/v, and magnetic properties of Ising and XY antiferromagnetic thin-films for different thickness layers n = 2, 3, 4, 5, 6, and bulk (∞).
关 键 词:high-temperature series expansions mean-field theory antiferromagnetic thin film Pade approximant Neel temperature critical exponent
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