基于PXI设备的自动测试系统实时性能分析  

Analysis to the Real Time Performance of ATS Based on PXI Device

作　　者：信朝阳[1] 刘亚斌[1] 周强[1] 

机构地区：[1]北京航空航天大学自动化科学与电气工程学院,北京100191

出　　处：《微计算机信息》2012年第8期22-24,共3页Control & Automation

摘　　要：为了测试常用自动测试系统Windows和RTX的实时性能,选取最为典型的两项性能指标进行实验研究,分别采用硬件时钟计数法和交替获取释放信号量的方法,对中断响应时间和上下文切换时间进行了测试,测试过程中对自动测试系统施加渐变负荷,得出负荷严重影响实时性能的结论,同时对实验数据进行了计算和比较分析,得出Windows具有弱实时性响应时间在毫秒级,而RTX具有强实时性响应时间在微秒级的结论,并提出了两种自动测试系统的应用环境。In order to evaluate the performance of common ATS, Wiridows and RTX, we choose two most typical functional parame ters to have an experiment. The interrupt response time and the context switching time are measured in the way of counting the number of hardware clock and getting and releasing the semaphore continuously. Through adding different burden, we get the conclu sion that the performance is influenced seriously by the level of burden. At the same time, the data are calculated and analyzed, we get another important conclusion that Windows has weak real time performance and the response time is in the level of millisecond, while RTX has strong real time performance and the response time is in the level of microsecond. At last, we have a recommenda tion about the suitable application.

关 键 词：自动测试系统 实时性能 中断响应时间 上下文切换时间 

分 类 号：TP31[自动化与计算机技术—计算机软件与理论]