基于线阵CCD的光电玻璃测厚方法研究  

Research on glass thickness measurement about photoelectricity based on linear array CCD

作　　者：兰羽[1] 周茜[1] 

机构地区：[1]陕西工业职业技术学院,陕西咸阳712000

出　　处：《电子设计工程》2012年第16期158-160,共3页Electronic Design Engineering

基　　金：陕西工业职业技术学院院级2010科研项目(ZK10-24)

摘　　要：玻璃厚度是衡量玻璃制品质量的一项重要性能指标。为了检测平板透明玻璃的厚度,提出了利用线阵CCD传感器作为光电接收器件的玻璃测厚装置,介绍分析了以CCD传感器作为光电接收器件透射式测厚法、单激光反射式测厚法、双激光反射式测厚法3种光路结构原理、以及性能特征。The glass thickness is an important performance indicator to measure the quality of glass products. In order to detect the thickness of flat-panel transparent glass, it put forwards the device of glass thickness measurement using linear array CCD sensor as a photoelectric receiver. It introduces and analyses three optical structure and principles for CCD sensor as a photoelectric receiver the method of transmission thickness measurement, the method of single and Dual laser reflector thickness measurement, it also analyses the characteristics of three methods.

关 键 词：线阵CCD传感器 透射式测量 单激光反射测量 双激光反射测量 

分 类 号：TN247[电子电信—物理电子学]