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机构地区:[1]武汉科技大学冶金自动化与检测技术教育部工程研究中心,湖北武汉430081
出 处:《华北电力大学学报(自然科学版)》2012年第4期72-76,共5页Journal of North China Electric Power University:Natural Science Edition
基 金:国家自然科学基金资助项目(60874109;61174107)
摘 要:建立了双闭环SVPWM整流器故障模型,通过增大IGBT模块内阻来模拟其性能劣化过程,并提出了一种基于Hilbert变换的IGBT模块故障诊断方法。该方法分别以相电流及其Hilbert变换后获得的共轭电流作横坐标和纵坐标,绘制Hilbert矢量图,通过图形变化规律来达到快速、有效诊断故障的目的。理论分析和仿真结果表明该方法可以有效诊断IGBT模块开路故障,比Park矢量方法简便直观。In this paper, a fault model of double closed-loop SVPWM rectifier is constructed. The inner resistances of IGBT modules are increased to simulate the deterioration process of IGBT modules. A fault diagnosis method of IGBT modules based on Hilbert transform is proposed. This method uses phase currents and its conjugate currents obtained from Hilbert transform of phase currents as horizontal axis and vertical axis respectively to draw the Hilbert' s vector diagram. A goal of fast and effective fault diagnosis through diagrams variation is achieved. Theoretical analysis and simulation results demonstrate that this method can diagnose the open circuit faults of IGBT modules effectively and it is simpler and more direct than Park' s Vector Method.
关 键 词:SVPWM整流器 IGBT开路故障 故障诊断 HILBERT变换 Hilbert矢量法
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