基于改进调制结构光的三维形状准确测量方法  

More accurate 3D scanning method based on improved modulation structure light

作　　者：韩成春[1] 席建中[1] 

机构地区：[1]徐州工程学院信电学院,江苏徐州221111

出　　处：《计算机工程与设计》2012年第9期3657-3660,F0003,共5页Computer Engineering and Design

摘　　要：针对结构光三维形状测量中投射结构光的相互反射而降低形状测量精度的问题,提出一种改进结构光三维形状测量方法。该方法是利用了直接反射和相互反射之间存在的相位差异,以格雷码为基础设计出新的调制结构光;向被测对象投射一系列调制结构光的正-反投影,并利用摄像机获取与其相对应的结构光条纹图像。通过该条纹图像的亚像素定位方法确定结构光的边缘。实验结果表明,该方法能够准确地分离或消除了相互反射,将提高结构光三维形状测量精度。In structured light three-dimensional shape measurement,the inter-reflection of projected structure light is presented to reduce the shape measurement accuracy.In order to separate and remove the inter-reflection,an improved structure light projection method is presented.The method is to use the phase difference between the direct reflection and inter-reflection,and to design a new structured light based on the gray code.After that project the passive and negative projection of improved structure light to the measured object and get the stripe images of the passive and negative projection of improve structure light by camera.Finally,using sub-pixel localization method the structured light edge is determined.The experimental results show this method can accurately separate and remove the inter-reflection,and improve the accuracy of the structure light three-dimensional shape measurement.

关 键 词：三维形状测量 相互反射 改进调制结构光 正-反投影 亚像素定位 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术]