X线胶片密度测量系统波谱分析及光源选择  

Waveband Analysis and Photosource Selection in the Densitometry for X- ray Films

作　　者：徐笑敏[1] 魏勤[2] 于凤珍[2] 

机构地区：[1]山东大学红外遥感研究所,济南250100 [2]山东省医学影像学研究所,济南250021

出　　处：《信息记录材料》2000年第1期48-49,24,共3页Information Recording Materials

摘　　要：X线胶片光学密度是胶片信息的外观表现 ,也是判断胶片质量的一个重要参数。其测量的精确依赖于测量系统的设定。本文就 X线胶片光学密度测量过程中系统波段设定对测量结果的影响进行了分析。结果表明 ,测量系统工作波段的选择是非常重要的。由于测量系统选用的实际光源其波段光强都是非均匀的 ,不同光源及工作波段的设定将造成胶片光学密度测量值间的差异。为使测量结果准确可靠 ,系统工作波段应尽量窄 ,测量系统光源应选用高光强、高稳定并与接受器件匹配的单色光源。The optical density of X- ray films is the objetive expression of the information on films.It is also an important parameter to determine the film quality.It's measurement precision is according to the enactment of the system.This paper analyses th influence of the waveband enactment on the result during the measurement process of X- ray film density. The result shows that working waveband selection of measurement system is very important. Because the waveband light intensity of the practical photosource is non- even,the diverseness of photosources and the working waveband enactment will create the discrepance amony measurement results. In order to get the accurate measurement values, the system waveband should narrow, the system photosource should chose monochrome photosource of high luminosity,stabilization,and match with receiving device. Keyword X- ray film Optical density Waveband Photosource

关 键 词：X线胶片 光学密度 光源 波谱分析 密度测量系统 

分 类 号：TQ577.25[化学工程—精细化工] TQ577.77