含缺陷复合绝缘子的加速老化试验  

Artificial Aging Tests with Defective Composite Insulators

作　　者：赵庆州 鲁兹[2] 梁飞[2] 张军广[2] 关志成[2] 王黎明[2] 

机构地区：[1]南方电网超高压输电公司天生桥局,贵州贵阳562400 [2]清华大学深圳研究生院能源与电工新技术实验室,广东深圳518055

出　　处：《陕西电力》2012年第8期25-28,共4页Shanxi Electric Power

基　　金：国家自然科学基金资助项目(51150110477)

摘　　要：对芯棒与护套交界面上含不同种类缺陷的复合绝缘子进行人工加速老化试验,缺陷包括人为内置的木片、铜片、部分区域脱粘等。对绝缘子样品施加逐步升高的交流电压,记录泄露电流与表面电流。同时在干燥与雾室环境下进行试验,研究缺陷类型、缺陷大小以及水分侵入对复合绝缘子老化过程的影响。加压过程中,当泄露电流超过2 mA时,水煮后的含缺陷绝缘子样品的温度将会明显升高,其中缺陷端部位置的温度最高,并且护套出现蚀损孔。当护套出现蚀损孔后,芯棒将直接暴露在外部环境中,这将加速复合绝缘子的老化过程,影响复合绝缘子的长期安全运行。In this study, artificial aging tests with composite insulators containing different defects at the sheath-core interface were performed. Samples including copper strips, wood strips and weak adhesion between sheath and core were considered. The samples were stressed by a step-wise increasing AC test voltage while the leakage current and the surface temperature were measured. The effect of the defect type, defect length and of absorbed water on the aging mechanism was investigated in dry and foggy environment. In case that the leakage current exceeds 0.2 mA, defective samples with absorbed water exhibited a significant increase of surface temperature. The highest temperature developed at the tip of the defects where puncturing of the silicone rubber sheath finally occurred. This puncturing mechanism is critical for the long-term performance of composite insulators since further aging mechanisms may be triggered afterwards

关 键 词：加速老化 复合绝缘子 含人造缺陷 水煮实验 蚀孔 

分 类 号：TM216[一般工业技术—材料科学与工程]