晶体管参数测试仪的设计  

Design of the transistor parameter tester

作　　者：张明英[1] 

机构地区：[1]西安外事学院,陕西西安710077

出　　处：《电子设计工程》2012年第18期73-74,77,共3页Electronic Design Engineering

摘　　要：以LM3S1138芯片作为控制核心,设计了一个晶体管参数测试系统。该系统主要功能模块包括:恒流源阶梯信号、电压扫描信号、升压电路、保护电路等。利用8位D/A转换器产生稳定的控制电压,通过集成在LM3S1138芯片中的10位A/D模块完成电压的测量。通过RS232接口将测量数据传送到PC机,利用Matlab软件实现对测量数据的处理和显示。测试结果表明:该晶体管参数测试仪工作良好,测量结果都在数据手册给的参数范围之内。A transistor parameters test system was designed using LM3S1138 single chip as its control core. The main function modules including： constant current source ladder, scanning signals, the voltage signal booster circuit, the protection circuit, etc. Using 8bit D/A converter generates a stable control voltage, 10bit A/D module integrated in LM3S1138 complete voltage measurement. The measurement data were transferred to PC by RS232 interface, using of Matlab software realization of measurement data processing and display. Test results show that the transistor parameter tester works well and the measurement results is within the range of data given in the data sheet.

关 键 词：晶体管参数测试 LM3S1138 恒流源 保护电路 串口通信 

分 类 号：TN307[电子电信—物理电子学]