扫描探针显微镜对纳米尺度铁电畴极化反转的研究  

Investigation of Nanoscale Ferroelectric Domains Switching by Multimode Scanning Probe Microscopy

作　　者：赵素玲[1] 

机构地区：[1]武汉理工大学材料研究与测试中心材料复合新技术国家重点实验室,湖北武汉430070

出　　处：《实验室研究与探索》2012年第4期16-18,71,共4页Research and Exploration In Laboratory

基　　金：新世纪优秀人才支持计划项目(NCET-05-0660)

摘　　要：利用扫描探针显微镜(SPM)的压电响应模式(PFM)和电场力响应模式(EFM)对PbTiO3/Pb(Zr0.3Ti0.7)O3/PbTiO3(PT/PZT/PT)夹心结构铁电薄膜的自发极化与纳米尺度电畴反转行为进行了研究。SPM的PFM对薄膜电畴的极化反转研究表明,在相同的有限电压下,薄膜的电畴因不同结构而不能全部反转而取向一致;同时,不对称电极产生的内建电压(场)会导致不同方向上极化反转电压的不同。SPM的EFM不宜用来研究铁电薄膜的自发极化电畴结构,但对电畴的取向极化有较高的区分度,适于研究电畴的取向极化。经正电压极化后,极化的区域呈高电势的亮区;经负电压极化后,表现为低电势的暗亮度区域。The spontaneous domain structure and nanoscale domain switching properties of sandwich structure PbTiO3/Pb（Zr0.3Ti0.7）O3/PbTiO3（PT/PZT/PT）thin films were investigated by scanning probe microscopy（SPM）in piezoresponse mode（PFM）and electrostatic force response mode（EFM）.The PFM results indicate that the domains can not be completely reversed by same external voltage.Meanwhile,the presence of the built-in voltage near the bottom electrode in the ferroelectric thin films can result in different reversed voltage in different directions.The EFM should not be used to investigate the spontaneous domain structures,but it can be used for investigating the polarized domains.The EFM domain images are in bright contrast after polarized by positive voltage,but in dark contrast after polarized by negative voltage.

关 键 词：扫描探针显微镜 铁电畴 电畴极化反转 

分 类 号：TB321[一般工业技术—材料科学与工程]