软X射线连续谱Z箍缩铝等离子体电子温度诊断  

Plasma electron temperature diagnosis in aluminum wire array Z-pinches based on soft X-ray continuum

作　　者：李沫[1] 邱孟通[1] 吴坚[1] 王亮平[1] 吴刚[1] 韩娟娟[1] 郭宁[1] 雷天时[1] 

机构地区：[1]西北核技术研究所,西安710024

出　　处：《强激光与粒子束》2012年第10期2493-2496,共4页High Power Laser and Particle Beams

基　　金：国家自然科学基金项目(10905047)

摘　　要：针对"强光一号"加速器(约1.5MA,80～100ns)Z箍缩铝丝阵实验设计和研制了一套弯晶谱仪,采用邻苯二甲酸氢铊(TlAP)晶体对辐射能谱进行色散,用X射线胶片记录连续辐射谱型,谱仪测谱范围为1.8～3.0keV。以第10084发次平面型铝丝阵负载实验为例,获得了具有轴向分辨的时间积分辐射谱型,对其中某一热斑处的数据进行处理得到了该区域等离子体时间积分电子温度约为520(1±35%)eV。A curved crystal spectrometer was developed on Qiang-guang I generator to measure the electron temperature of aluminum planar wire array Z pinches. The spectrometer is composed of an elliptically-curved T1AP crystal and a Biomax-MS film, and the spectral range is from 1.8 keV to 3.0 keV, which covers part of the H-like and He-like K shell lines and continu- um. The time-integrated spectra with axial distinction for shot 10084 with a planar aluminum wire array load were recorded by the spectrometer. The slope of the continuum radiated from a hot spot indicates an electron temperature of 520（1±35 %）eV.

关 键 词：Z箍缩 连续谱 电子温度 等离子体 弯晶谱仪 

分 类 号：O536[理学—等离子体物理]