红外晶体材料应力双折射测试方法研究  

The Research for the Measurement Method of Stress Birefringence of Infrared Crystal Material

作　　者：撖芃芃[1] 刘家燕[1] 

机构地区：[1]中国科学院长春光学精密机械与物理研究所,长春130033

出　　处：《长春理工大学学报（自然科学版）》2012年第3期54-58,共5页Journal of Changchun University of Science and Technology(Natural Science Edition)

基　　金：国家创新方法工作专项项目(2008IM040700);吉林省科技支撑计划项目(20106011)

摘　　要：本文详细介绍了一种用于红外波段测量红外晶体材料应力双折射的测试方法。选择了3.39μm的激光作为测试光源,选择蓝宝石晶体为待测红外晶体材料,同时在传统1/4波片测试法的基础上进行了改进,使该方法可以用来测量红外晶体材料的应力双折射;为了能达到最小可探测光程差小于10nm/cm的目标要求,对于测量过程中所使用到的各种元器件进行了误差分配模拟计算,通过精度分析,认为使用1/4波片法是能够测量红外晶体材料的应力双折射光程差的,通过模拟计算可得单次测量的合成测量不确定度为6.3nm/cm。该测试方法可广泛应用于各种红外晶体材料红外波段的应力双折射测试当中,具有较高的测量精度。This paper introduced a measure method for stress birefringenee of infrared crystal material which was used in infrared bound.This measure method can be used to measure the stress birefringenee of infrared crystal material by ameliorating the tradition 1/4 wave plate method which 3.39μm laser was ehoosed as measure light source and sapphire crystal was choosed as infrared crystal material.We thought that this method could be used to measure the stress bire- fringence optical path difference of infrared crystal material by [）recision analyzing which used error for distributing calcu- late for the every element used in the process of measuring, and the method could satisfied with the request that the least optical path difference less than 10nm/cm.We obtained the single measure compose uncerlainty result was 6.3nm/ cm by analog computation.We also thought that this method can be used widely in the various infrared crystal material stress birefringence measure fields with high measure precision.

关 键 词：红外晶体材料 1/4波片法 应力双折射 光程差 

分 类 号：TN252[电子电信—物理电子学]