A Computerized System for the Measurement of Nanomaterial Field Emission and Ionization  

作　　者：王泽松 张早娣 何俊 李载春 刘传胜 吴先映 付德君 

机构地区：[1]Accelerator Laboratory,School of Physics and Technology,Wuhan University [2]Key Laboratory of Beam Technology and Material Modification of Ministry of Education,Beijing Normal University [3]Quantum-Functional Semiconductor Research Center,Dongguk University [4]Department of Physics,Three Gorges University

出　　处：《Plasma Science and Technology》2012年第9期819-823,共5页等离子体科学和技术（英文版）

基　　金：supported by National Natural Science Foundation(No.11075121);the International Science and Technology Cooperation Program(No.2010DFA02010);Three Gorges University of China(KJ2009B011)

摘　　要：We have developed a computerized system for measuring field electron emission （FE） and field ionization （FI）, which has a three-electrode configuration with emitters biased up to 25 kV, and is programmed by the Labview software. The current-voltage curves of nano-tip tungsten and carbon nanotube （CNT） arrays were measured. The electron emission of CNTs proceeded with a turn-on field of 1.24 V/μm and a threshold field of 1.85 V/μm. Compared to the field emission, field ionization turned on at 3.5 V/μm. Raman spectroscopy and scanning electron microscopy （SEM） measurements showed degradation of the CNTs after FE/FI testing. The measurement of a W-tip revealed strong electron emission and instability behavior at a field strength higher than 7.0 V/μm.We have developed a computerized system for measuring field electron emission （FE） and field ionization （FI）, which has a three-electrode configuration with emitters biased up to 25 kV, and is programmed by the Labview software. The current-voltage curves of nano-tip tungsten and carbon nanotube （CNT） arrays were measured. The electron emission of CNTs proceeded with a turn-on field of 1.24 V/μm and a threshold field of 1.85 V/μm. Compared to the field emission, field ionization turned on at 3.5 V/μm. Raman spectroscopy and scanning electron microscopy （SEM） measurements showed degradation of the CNTs after FE/FI testing. The measurement of a W-tip revealed strong electron emission and instability behavior at a field strength higher than 7.0 V/μm.

关 键 词：field emission field ionization measuring system nano materials 

分 类 号：TB383.1[一般工业技术—材料科学与工程]