基于NI软件的S参数自动测量系统  

Automatic Measurement System for S-parameters Based on Software of NI Company

作　　者：童川[1] 尹秋艳[1] 梅萌[1] 

机构地区：[1]华东师范大学,上海200241

出　　处：《机电产品开发与创新》2012年第5期125-126,共2页Development & Innovation of Machinery & Electrical Products

摘　　要：为了提高手动测量微波器件相关产品的S参数的效率,解决测试报告生成自动化问题,根据产品的测试原理和要求,结合TestStand和Labview这两款NI软件的各自优势,从而实现产品相关参数测试的自动化。论文介绍了该系统的构成,详细介绍软件设计流程和功能实现,测试实例表明:该系统提高了测试效率,精度高。In order to improve the efficiency of the manual ic, based on the theory of t of S parameters and to make the generation of test report automat t, an automatic measurement system is designed regarding TestStand and Labview as a platform in this paper. The composition of the system especially the software design and its functions are introduced, the results of test case show that the sys tem works efficiently with high precision.

关 键 词：微波器件 TESTSTAND LABVIEW S参数 测量系统 

分 类 号：TP317[自动化与计算机技术—计算机软件与理论]