我国纳米标准样品研究进展  

Research Progress of Nanoscale Reference Materials in China

作　　者：刘忍肖[1] 高洁[2,3] 葛广路[1] 

机构地区：[1]国家纳米科学中心纳米标准研究室 中国科学院纳米标准与检测重点实验室 [2]国家纳米科学中心科技管理部 [3]全国纳米技术标准化技术委员会(SAC/TC279)

出　　处：《中国标准化》2012年第10期80-84,共5页China Standardization

摘　　要：纳米科技的迅猛发展促进了纳米测量技术的创新并对其不断提出更高的要求。在纳米尺度上对物质的结构、光、电、磁、力等物理化学性质进行测量时易受外界因素的干扰,而纳米标准物质/标准样品的应用能够在纳米测量技术的不确定性评估、验证新测量技术的可靠性等方面发挥重要作用。本文对我国所研制的、具有国际水平的纳米尺度测量用和功能特性纳米标准物质/标准样品的研究进展进行了扼要介绍。The fast development of nanoscience and technology requires constant advancement and keeps pushing the limit of nano- measurement techniques. However, when measuring the microscopic dimensions and structures, optical, electrical, magnetic, and mechanical properties of uanomaterials, the measurement results are very sensitive to environmental factors. The use of nanoscale RMs will play an important role in the uncertainty evaluation of nano-measurement techniques and the reliability verification of new measurement methods. This paper introduces briefly the latest research progress of nano-RMs in China, which have been at the same pace with other countries. They include two types： RMs for nano-scale measurements and RMs with functional properties.

关 键 词：IEC/ISO 62264 国际标准 信息化 

分 类 号：TB383.1[一般工业技术—材料科学与工程]