锡晶须生长机理研究的现状与问题  

Mechanisms and questions of tin whisker growth

作　　者：赵子寿[1] 冼爱平[1] 

机构地区：[1]中国科学院金属研究所沈阳材料科学国家(联合)实验室,沈阳110016

出　　处：《中国有色金属学报》2012年第8期2267-2275,共9页The Chinese Journal of Nonferrous Metals

基　　金：国家自然科学基金资助项目(50871119)

摘　　要：介绍锡晶须的发现过程以及机制研究和预防策略,总结锡晶须生长过程中已经被一些研究人员发现的特点,如晶须形貌的多样性、生长过程的阶段性以及生长位置的不确定性等。回顾从最初发现锡晶须到现在所提出的用于解释锡晶须生长机理的理论模型,其中主要是位错机制、压应力机制、再结晶机制、氧化膜破裂机制以及活性锡原子机制。在对于这些理论模型的问题进行评述后,对如何进一步探索晶须的生长机理提出一些看法。The discovery processes of tin whiskers as well as the mechanism research and the prevention strategies were introduced. Meanwhile, some certain characteristics during the tin whisker growth, such as the polymorphism of morphology, the uncertainty in growth position, and so on, which had already been observed by some researchers were summarized. The tin whisker growth mechanisms proposed from the initial discovery stage to the present were reviewed, they are mainly the dislocation mechanism, the compressive stress mechanism, the recrystallization mechanism, the cracked oxide theory and the fresh tin atom mechanism. After making some comments on the problems of the theoretical models, some further suggestion for the whisker growth mechanism were put forward.

关 键 词：锡晶须 理论模型 生长机理 

分 类 号：TQ153.13[化学工程—电化学工业]