磁光记录薄膜的偏振特性分析  

Analysis of Polarization Properties of Magneto-Optic Recording Thin Films

作　　者：王可[1] 蔡长波[1] 李佐宜[1] 谭立国[1] 王翔[1] 胡煜[1] 

机构地区：[1]华中理工大学电子科学与技术系,湖北武汉430074

出　　处：《磁性材料及器件》2000年第3期10-14,共5页Journal of Magnetic Materials and Devices

摘　　要：光线入射至磁光记录薄膜表面时，由于其入射角和方位角不同，导致磁光薄膜的偏振特性有较大变化，本文运用电磁场理论，对磁光记录薄膜偏振特性随入射角和方位角变化进行了分析。When the light beam incides on the surface of the magneto-optic thin film, the properties of polarization of the film will change greatly from the original state due to the different incident angles and azimuth angles. In this paper,we will analysis the polarization property dependence on the incident and azimuth angles for the magneto-optic recording thin films using electromagnetic theory.

关 键 词：磁光记录薄膜 偏振特性 入射角 方位角 

分 类 号：O484.41[理学—固体物理]