基于可测性分析的模拟电路多频测试矢量生成  

Generation of Multi-Frequency Test Vector for Analog Circuits Based on Testability Analysis

作　　者：王承[1] 刘治国[2] 叶韵[1] 梁海浪[1] 何进[1] 

机构地区：[1]北京大学深港产学研基地深圳市系统芯片设计(SOC)重点实验室,广东深圳518057 [2]工业和信息化部电子第五研究所,广州510610

出　　处：《微电子学》2012年第5期737-740,共4页Microelectronics

基　　金：国家自然科学基金资助项目(60936005);深圳市杰出青年项目(JC201005280670A)

摘　　要：提出一种基于可测性分析的模拟电路多频测试矢量自动生成方法。根据待测电路可利用的测试点,进行测试点优选和模糊元器件确定,实现可测性分析;应用灵敏度分析,实现多频测试矢量自动生成。实验结果表明,该方法对模拟电路测试矢量生成非常有效,具有很强的实用性。A method for generation of multi-frequency test vector for analog circuits was proposed based on testability analysis.Test points in analog circuits were properly chosen and ambiguity groups were defined using testability analysis.Test vectors were automatically generated by sensitivity computation.Experimental results showed that this method was both effective and practical for generation of test vectors in analog circuits.

关 键 词：可测性分析 模拟电路 多频测试矢量 故障诊断 

分 类 号：TP206.3[自动化与计算机技术—检测技术与自动化装置]