基于厚度增强因子的X射线厚度测量模型  

X-ray thickness measurement model based on enhancement factor

作　　者：于子金[1] 周意俊[1] 朱晶[1] 

机构地区：[1]宝山钢铁股份有限公司设备部,上海201900

出　　处：《宝钢技术》2012年第5期50-54,58,共6页Baosteel Technology

摘　　要：通过对X射线测厚仪测量机理的研究,剖析了其机理模型黑匣子。同时根据现场情况,分析射线衰减系数、散射效应以及样板材质等对X射线测厚仪测量精度的影响,提出了一种带厚度增强因子的非线性模型。试验结果表明,厚度在0.1～2.5 mm范围内,该模型只需要测量5个厚度点即完成基准曲线制作,测量精度可达到0.1%以内,简化了操作工序。Through the research on the x-ray thickness gauge system, the black box of the mechanism model has been deciphered. At the same time, according to the actual production situation, a non-linear gauging model of steel plates with the thickness enhancement factor, which is based on the X-ray transmission technique, has been proposed, through the analysis on attenuation coefficient, scattering effects and material of samples. The experiment results show that when the thickness is between 0.1 mm to 2.5 mm, the model only needs to measure five pieces of standard steel plates, and the measurement error is within 0.1%. Therefore, the model simplifies the operating process and effectively reduces the failure probability.

关 键 词：X射线测厚仪 厚度增强因子 机理模型 最小二乘法 

分 类 号：TH821.1[机械工程—仪器科学与技术]