X射线荧光光谱法测定硅石、硅砖的主次成分  

Determination of Leading and Secondary Compositions in Silica and Silica Brick by X-ray Fluorescence Spectrometry

作　　者：王一凌[1] 

机构地区：[1]鞍钢股份有限公司技术中心,辽宁鞍山114009

出　　处：《鞍钢技术》2012年第5期24-27,共4页Angang Technology

摘　　要：利用高温熔融制备硅石、硅砖样品,应用X射线荧光光谱法测定硅石、硅砖中SiO2、Al2O3、CaO、MgO、Fe2O3等主次成分的百分含量。通过国家标准物质和合成校准样品制作校准曲线,研究了熔剂的选择及其与样品的稀释比例,脱膜剂加入量对制样重现性的影响,探讨了采用差量法计算所得结果的准确性。实验结果表明,该方法的测定值与标准认定值一致,相对标准偏差小于5%,满足了硅石中常见组分快速分析的要求。The samples are prepared from silica and silica brick by melting at high tempera ture and then percentage mass content of leading and secondary compositions such as SIO2,A1203, CaO ,MgO ,Fe203 in silica and silica brick are determined by X-ray fluorescence spectrometry. The calibration curves are made by the national standard reference material and synthetic calibration samples. Such researches as selecting the fluxes, defining the dilution ratio of samples and the ef- fect of remover-adding amount on repeatability of the prepared samples are done and finally the accuracy of results calculated by difference method is discussed. The experimental results show that the measured values by this method accord with certified values specified in standard with relative standard deviation less than 5%, which meet the requirements required by quickly analyz- ing the common compositions in silica.

关 键 词：X射线荧光光谱法 硅石 硅砖 主次成分 差量法 

分 类 号：O657[理学—分析化学]