用PAT研究SrTiO_3双功能陶瓷的缺陷结构  

A Study on Defect Structure of SrTiO_3 Capacitor-Varistor Ceramics by PAT

作　　者：李建英[1] 李盛涛[1] 庄严[2] 

机构地区：[1]西安交通大学电力设备电气绝缘国家重点实验室,西安710049 [2]广州通信研究所,广州510310

出　　处：《电子学报》2000年第8期127-128,共2页Acta Electronica Sinica

摘　　要：测定了不同气氛烧结的SrTiO3 双功能陶瓷的正电子湮灭 (PAT)寿命谱 ,其平均寿命随着烧结气氛中H2含量的增加而减小 .这是还原烧结气氛使瓷体中形成较多的氧缺位 ,氧缺位捕获两个弱束缚电子形成F′ 色心所致 .弱束缚电子在禁带内形成局域能级 ,并使材料的电子浓度增大 .x衍射分析结果证明了材料晶体结构的变化 .The lifetime spectra of positrons in SrTiO 3 capacitor varistor ceramics sintered in different atmospheres were measured.The average lifetime decreases with an increase of H 2 percentage in sintering atmosphere.More oxygen vacancies are produced in more strongly reducing atmosphere,and more F′ centers are formed because oxygen vacancies will catch electrons.As a result,the lifetime of positron is reduced.The PAT results also show the changes in electron concentration and in energy band structure of samples sintered in different atmospheres.The results were supported by x ray diffraction analysis.

关 键 词：SrTiO3陶瓷 PAT 双功能陶瓷 缺陷结构 

分 类 号：TN304.82[电子电信—物理电子学]