合肥光源单束团纵向分布的测量研究  

Measurement of Longitudinal Distribution of Bunch in HLS

作　　者：王季刚[1] 孙葆根[1] 杨永良[1] 卢平[1] 周泽然[1] 唐雷雷[1] 栗武斌[1] 徐宏亮[1] 

机构地区：[1]中国科学技术大学国家同步辐射实验室核科学技术学院,安徽合肥230029

出　　处：《原子能科学技术》2012年第B09期534-538,共5页Atomic Energy Science and Technology

基　　金：国家自然科学基金资助项目(11175173)

摘　　要：在合肥光源单束团运行模式下使用条纹相机测量其纵向分布,研究和验证引起束团纵向分布产生变化的影响因素。对势阱效应引起束团纵向分布的影响进行了理论分析,给出了电感性阻抗和电阻性阻抗对束团分布影响的模拟计算结果。进行了束团长度拉伸效应、束团势阱扭曲现象等测量研究,并讨论了条纹相机观测束团势阱扭曲现象的测量模式。根据束团长度拉伸效应和势阱扭曲与模拟计算结果对比,得出合肥光源储存环的低频纵向宽带耦合阻抗约为4.4Ω。Streak camera was used to measure the longitudinal distribution of single bunch in Hefei Light Source.The result was used to research and verify the changes of longitudinal distribution of single bunch.The theoretical analysis was made for the effect of the potential well impacting on the bunch longitudinal distribution.The simulation results were given for the effect of the inductive impedance and resistive impedance impacting on the bunch distribution.Some experiments were made,for example,on the bunch length lengthening,and potential well distortions.The measurement mode was discussed about the potential well distortion of the bunch.The broadband coupled impedance of low frequency of storage ring is about 4.4 Ω by comparing the measured bunch length dependence on the current and comparing it to simulations in HLS.

关 键 词：条纹相机 束团纵向分布 势阱效应 宽带耦合阻抗 

分 类 号：TL594[核科学技术—核技术及应用] TL506