低温晶体失效故障分析  

Failure analysis of crystal oscillator in low temperature

作　　者：刘冰[1] 孙爱中[1] 

机构地区：[1]中国航空计算技术研究所,陕西西安710068

出　　处：《现代电子技术》2012年第22期125-126,129,共3页Modern Electronics Technique

摘　　要：在计算机的实验中,晶体在温度试验条件下,性能不稳定,导致计算机无法正常工作。通过对晶体的失效分析,确定了晶体失效的原因。结果表明:由于晶体谐振器内部晶片的形成结构异常造成晶体谐振器与振荡电路不能相互匹配,因而在低温条件下表现出来,这种晶体谐振器内部晶片结构异常是导致计算机无法正常工作的原因。通过对晶体谐振器进行温度频差测试,发现晶体谐振器早期失效问题,可解决这一问题,验证试验表明这一措施有效、可行。It was found that the performance of crystal oscillator was not stable in temperature testing for computer experiment. It causes the abnormal work of computer. The reason of crystal oscillator＇s failure was found out by analyzsis. The result shows that the crystal resonator can not match with oscillator circuit due to the structural abnormality of wafers in the crystal resonator. The defect is manifested at low temperature. This crystal resonator internal structural abnormities is the reason which causes improper work of the computer. A way to solve the failure was found in the crystal resonator frequency difference test. The issue validation tests show that this measure is feasible and effective.

关 键 词：晶体谐振器 失效分析 低温条件 频差测试 

分 类 号：TN305-34[电子电信—物理电子学]