基于全息的太赫兹紧缩场测量技术  

THz Band Hologram-based Compact Antenna Test Range

作　　者：张领飞[1] 秦顺友[1] 

机构地区：[1]中国电子科技集团公司第五十四研究所,河北石家庄050081

出　　处：《无线电工程》2012年第11期37-39,43,共4页Radio Engineering

摘　　要：用传统反射面紧缩场法测量太赫兹高增益天线,要求紧缩场的反射面表面加工精度小于百分之一波长,不易制造,且非常昂贵。针对这一问题,介绍了一种新型易于构建的基于全息紧缩场测量技术,简述了全息紧缩场天线测量原理,利用时域有限差分法和物理光学法对全息紧缩场进行电磁场数值计算,并设计仿真了频率为310 GHz的全息紧缩场,所生成的静区幅度波动小于1 dB,相位波动小于10°,能够达到紧缩场测试的要求。The application of conventi onal reflector-type compact antenna test range（CATR） in the measurement of high-g ain antenna becomes increasingly difficult at THz band,as the reflector surface accuracy used in compact range should be less than one hundredth of the waveleng th,which is difficult to manufacture and is expensive. To solve this problem,a novel easy-to-fabricate hologram type compact antenna test range is introduced.A bri ef review of the principle of the CATR based on hologram is presented. The finite difference time domain and physical optic s are used to calculate the CATR based on hologram.A hologram-based CATR is des igned and simulated at 310 GHz.In the quiet zone,the peak-to-peak amplitude ri pple is less than 1 dB and the phase ripple is less than 10°,and all the requir ements on compact test ranges can be satisfied.

关 键 词：全息 紧缩场 太赫兹 天线测量 

分 类 号：TN820[电子电信—信息与通信工程]