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机构地区:[1]中国计量学院光学与电子科技学院,杭州310018
出 处:《光电工程》2012年第11期134-137,共4页Opto-Electronic Engineering
基 金:国家科技支撑资助项目(2011BAF06B02);浙江省科技创新团队资助项目(2010R50020);上海市科委资助项目(0595812300)
摘 要:在分光光度测色仪的双光路d/0结构设计中,通常采用积分球内壁作为参考点来消除光源波动对仪器重复性产生的影响。但是在这种情况下,参考信号在一定程度上会受到测试样品的漫反射光的干扰,仪器的重复性和准确性也随之降低。本文设计了一种改进的d/0测量结构,采用LED复合光源作为测试光源,在参考光路设置单独的参考白壁,而不再将积分球内壁作为参考点,并建立实验进行验证。实验结果表明,改进的光路结构可以有效的消除被测试样品的漫反射光对参考光路信号的影响。In order to eliminate the errors resulting from fluctuation of light source, the inner surface of integrating sphere is selected as reference in design of dual-optical path d/0 measuring condition on spectrophotometer. However, the repeatability and accuracy of measurement will decrease to a certain degree because of interference by diffuse reflected light of the test sample. This paper improves the dual-optical path d/0 measuring condition, composites LED as test light source, and configures a separated referenced white board substitute for inner surface of integrating sphere in the reference optical path. Then, the experiment is established. The results indicate that this improved dual-optical path d/0 measuring condition could effectively revise the errors caused by diffuse reflected light of test sample.
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