投影栅相位法曲面形体检测系统结构的分析  

System construction of curved surface measurement technique by phase approaching of projected grating

作　　者：由志福[1] 钟约先[1] 许庆红[1] 曹起骧[1] 

机构地区：[1]清华大学机械工程系,北京100084

出　　处：《清华大学学报（自然科学版）》2000年第5期5-8,共4页Journal of Tsinghua University(Science and Technology)

摘　　要：针对投影栅相位法检测精度不够高和可操作性不强的问题 ,从检测系统的原理出发进行了全面分析 ,并在此基础上提出了一种新的系统结构 ,其核心是应用摄像机定标技术。新系统消除了现有系统结构的系统误差 ,减轻了系统标定的复杂程度。实验证明它具有较强的可操作性和较高的检测精度 ,相对检测精度达到 1/ 3 0 0Comprehensive analysis of system construction method was performed to improve the precision and maneuverability of measurement technique by phase approaching of projected grating. The analysis of the new system construction method has a camera calibration algorithm as its core. The new system eliminates systematic error of the traditional systems and alleviates the complicated system calibration. The maneuverability and high accuracy of the new system construction method are verified in practice with the relative accuracy reaching 1/3000.

关 键 词：摄像机定标 投影栅相位法 曲面形体 非接触检测 

分 类 号：TG839[金属学及工艺—公差测量技术]