PLZT薄膜弛豫时间分布与极化特征研究  

Distribution of relaxation time and polarization process for PLZT film

作　　者：张超[1] 迟媛媛[1] 余大书[1] 

机构地区：[1]天津师范大学物理与电子信息学院,天津300387

出　　处：《天津师范大学学报（自然科学版）》2012年第4期47-50,共4页Journal of Tianjin Normal University：Natural Science Edition

基　　金：天津市高等学校科学发展基金资助项目(20041022);天津师范大学博士基金资助项目(5RL019);天津师范大学与上海天泰茶业科技有限公司横向课题资助项目(53H10059)

摘　　要：对溶胶-凝胶法制备的PLZT薄膜进行介电温度谱测试,根据不同温度ε′-ε″曲线的Cole-Cole经验公式进行拟合,并对PLZT薄膜的弛豫铁电体特性进行分析.实验结果表明:样品出现弥散相变,属于弛豫铁电体,且内部存在氧缺陷;样品的介电常数、最可几弛豫时间以及由经验公式拟合得到的温度函数在100～110℃温度范围内出现异常,结合材料介电响应理论说明材料晶体结构类型出现变化.PLZT film by sol-gel process was tested for dielectric spectrum including the dielectric spectrums for temperature.Through the fitting of ε′-ε″experimental curves in different temperatures by using Cole-Cole empirical equation, the relaxation ferroelectric features of the PLZT film were analyzed.The results show that ： the sample has the relaxation ferroelectric character, which has dispersion phase transition, and there are oxygen defects in the film sample.The temperature functions of dielectric constant, the most probable relaxation time and the fitting parameter hof experimental curve have abnormal features in 100 — 110℃, showing the crystal structure has changed within the material according to material dielectric response theory.

关 键 词：溶胶-凝胶法 弛豫铁电体 介电谱 弛豫时间分布 

分 类 号：O484.42[理学—固体物理]