一种基于PIN型光电二极管频率响应的测试方法  

Test method of frequency response based on PIN photoelectric diode

作　　者：管敏杰[1] 赵冬娥[1] 

机构地区：[1]中北大学电子测试技术重点实验室,仪器科学与动态测试教育部重点实验室,山西太原030051

出　　处：《应用光学》2012年第6期1088-1091,共4页Journal of Applied Optics

基　　金：教育部科学技术研究重点项目(211027);山西省科技基础条件平台建设项目(2010091013)

摘　　要：根据信号系统相关理论,提出了一种针对该类光电探测器频率响应的测试方法。该方法实现的测试系统主要包括窄带脉冲激光光源、光强衰减装置和光电探测器等。由光电探测器接收经过光强衰减后的窄带激光脉冲信号,同时利用数字示波器获得相应信号波形的上升时间;根据相关的计算公式,得到光电探测器的频率响应;对所得测试结果进行误差分析。实验结果表明:对理论频率响应带宽为10.6MHz的探测器,利用该方法测得的相对误差为6%左右,该测试方法简单、可行,适用范围广。According to the relevant theory of the signals and systems, a test method for fre- quency response of the PIN photoelectric diode detector was proposed. The test system realized by the method includes the light source of the narrowband pulse laser, the attenuation device of the light intensity and the photoelectric detector, etc. Firstly, the photoelectric detector re- ceived the signal of the narrowband pulse laser which went through the attenuation device, meanwhile, the rise time of the corresponding signal waveform was obtained by the digital os- cilloscope. Then, according to the relevant calculation formula, the frequency response of the photoelectric detector was got. Finally, the error of test results was analyzed. The experimen- tal result shows that the relative error by this method is about 6 % of the detector whose theo- retical frequency response bandwidth is 10.6MHz, and the test method is simple,feasible and applied widely .

关 键 词：光电探测 频率响应 光电二极管 上升时间 

分 类 号：TN364[电子电信—物理电子学]