A new short-anoded IGBT with high emission efficiency  被引量:2

A new short-anoded IGBT with high emission efficiency

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作  者:陈伟中 张波 李泽宏 任敏 李肇基 

机构地区:[1]State Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of China

出  处:《Journal of Semiconductors》2012年第11期48-51,共4页半导体学报(英文版)

基  金:supported by the National Natural Science Foundation of China(Nos.60806025,61076082)

摘  要:A novel short-anoded insulated-gate bipolar transistor(SA-IGBT) with double emitters is proposed.At the on-state,the new structure shows extraordinarily high emission efficiency.Moreover,with a short-contacted anode,it further enhances the hole emission efficiency because of the crowding of the electrons.The forward voltage drop V_F of this structure is 1.74 V at a current density 100 of A/cm^2.Compared to the conventional NPT IGBT(1.94 V),segment-anode IGBT(SA-NPN 2.1 V),and conventional SA-IGBT(2.33 V),V_F decreased by 10%,17%and 30%,respectively.Furthermore,no NDR has been detected comparing to the SA-IGBT.At the off-state, there is a channel for extracting excessive carriers in the drift region.The turn-off loss E_(off) of this proposed structure is 8.64 mJ/cm^2.Compared to the conventional NPT IGBT(15.3 mJ/cm^2),SA-NPN IGBT(12.8 mJ/cm^2), and SA-IGBT(12.1 mJ/cm^2),E_(off) decreased by 43.7%,32%and 28%,respectively.A novel short-anoded insulated-gate bipolar transistor(SA-IGBT) with double emitters is proposed.At the on-state,the new structure shows extraordinarily high emission efficiency.Moreover,with a short-contacted anode,it further enhances the hole emission efficiency because of the crowding of the electrons.The forward voltage drop V_F of this structure is 1.74 V at a current density 100 of A/cm^2.Compared to the conventional NPT IGBT(1.94 V),segment-anode IGBT(SA-NPN 2.1 V),and conventional SA-IGBT(2.33 V),V_F decreased by 10%,17%and 30%,respectively.Furthermore,no NDR has been detected comparing to the SA-IGBT.At the off-state, there is a channel for extracting excessive carriers in the drift region.The turn-off loss E_(off) of this proposed structure is 8.64 mJ/cm^2.Compared to the conventional NPT IGBT(15.3 mJ/cm^2),SA-NPN IGBT(12.8 mJ/cm^2), and SA-IGBT(12.1 mJ/cm^2),E_(off) decreased by 43.7%,32%and 28%,respectively.

关 键 词:short-anode insulated-gate bipolar transistor snapback turn-off tradeoff 

分 类 号:TN322.8[电子电信—物理电子学] TM923.321[电气工程—电力电子与电力传动]

 

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