An embeddable SOC real-time prediction technology for TDDB  

作　　者：辛维平 庄奕琪 李晓明 

机构地区：[1]School of Microelectronics,Xidian University

出　　处：《Journal of Semiconductors》2012年第11期105-109,共5页半导体学报（英文版）

基　　金：supported by the National Natural Science Foundation of China(No.60376023)

摘　　要：This paper presents an embeddable SOC real-time prediction circuit and method for TDDB.When the SOC under test is fails due to TDDB,the prediction circuit is capable of issuing a warning signal.The prediction circuit,designed by using a standard CMOS process,occupies a small silicon area and does not share any signal with the circuits under test,therefore,the possibility of interference with the surrounding circuits is safely excluded.This paper presents an embeddable SOC real-time prediction circuit and method for TDDB.When the SOC under test is fails due to TDDB,the prediction circuit is capable of issuing a warning signal.The prediction circuit,designed by using a standard CMOS process,occupies a small silicon area and does not share any signal with the circuits under test,therefore,the possibility of interference with the surrounding circuits is safely excluded.

关 键 词：TDDB real-time reliability prediction SOC 

分 类 号：TN47[电子电信—微电子学与固体电子学]