薄膜型纳秒壁流探测器的研制及应用  

Development of Film-mode Wall Current Monitor and Its Application

作　　者：王贵诚[1] 冷用斌[1] 孙葆根[1] 方志高[1] 赵枫[1] 陶小平[1] 周耀华[1] 何晓业[1] 刘广俊 李广映 方蕾 

机构地区：[1]中国科学技术大学国家同步辐射实验室,安徽合肥230029 [2]中国科学院安徽光学精密机械研究所,安徽合肥230031

出　　处：《原子能科学技术》2000年第3期223-227,共5页Atomic Energy Science and Technology

摘　　要：国家同步辐射实验室和安徽光学精密机械研究所共同研制的薄膜型纳秒壁流探测器以其占有空间小、电阻膜特性连续、均匀等优点在HLS(HefeiLightSource)中得到实际应用 。A film mode wall current monitor is developed in National Syncrotron Radiation Laboratory(NSRL) in cooperation with Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences. The film mode resistors with good continuity and uniformity are developed. The monitors are used on line with success in hefei light source(HLS).

关 键 词：薄膜型电阻 壁流探测器 单束团束流 束流强度 

分 类 号：TL506[核科学技术—核技术及应用]