FP法在SDD-EDXRF无标样分析技术中的应用研究  

The Application of Fundamental Parameters Method in EDXRF Based on SDD

作　　者：刘敏[1] 庹先国[1,2] 李哲[1] 石睿[1] 

机构地区：[1]成都理工大学地学核技术四川省重点实验室,成都610059 [2]地质灾害防治与地质环境保护国家重点实验室,成都610059

出　　处：《核电子学与探测技术》2012年第9期1096-1099,1104,共5页Nuclear Electronics & Detection Technology

基　　金：国家杰出青年科学基金(41025015);国家自然科学基金(40974065);核退役与核废料处置四川省青年科技创新研究团队(2011JTD0013);成都理工大学优秀创新团队培育计划(CDUTHY0084)资助

摘　　要：为实现能量色散X荧光(EDXRF)技术对元素含量的无标样分析,建立了基本参数法(FP法)数理分析模型,并计算得到了模型中质量吸收系数(μ)、激发因子(E)等关键参数。实验中,利用基于硅漂移探测器(SDD)的EDXRF测量系统(SDD-EDXRF),对Fe-Cu、Fe-Ti两种伪二元体系样品进行能谱测量,并采用自行开发的FP法计算程序,分析得到了混合样品中各元素含量,含量的计算值与实际值的最低相对误差小于2%,精密度相对标准偏差低于0.8%。结果表明,所建立的FP法分析模型,能较好克服元素间的吸收增强效应,可应用于SDD-EDXRF的无标样分析过程。It created the FP mathematical analysis model in order to use EDXRF technique to analyze element contents without sample and gained the key parameters of the model such as mass absorption coefficients and excitation factors. In experiment, two kinds of pseudobinary system containing Fe Cu and Fe Ti were ana lyzed with an energy dispersive X ray analyzer based on a SDD and each element content of the samples were calculated via the FP calculation procedure, the deviation of the accuracy is no more than 0.8 % and the lowest relative error between calculated value and actual value is 2% . The result shows the FP method can overcome the absorption and enhancement effects between elements and apply to SDD EDXRF analysis process well with no sample.

关 键 词：能量色散X荧光分析 基本参数法 硅漂移探测器 伪二元系 

分 类 号：O657.34[理学—分析化学]