基于普通X射线机的厚度测量  

Measure thickness with industrial X-ray machine

作　　者：蔡闰生[1] 

机构地区：[1]航天材料及工艺研究所,北京100076

出　　处：《中国测试》2012年第6期23-25,共3页China Measurement & Test

摘　　要：通常情况下,X射线底片黑度是测试过程中管电压、管电流、材料密度、测试厚度、胶片特性、冲洗条件以及散射线防护等多种因素共同作用的结果。但特定条件下,通过简化设计,可以使黑度的变化相对单一地表现出厚度的变化,并由此建立底片黑度与厚度之间的联系,使其可以从厚度与黑度的对应数据出发,通过回归分析的方法,寻找出厚度与黑度的内在关联规律。进而通过射线能量、射线强度等参数对这种指数规律的影响分析和实测验证,最终确定应用普通X射线机进行厚度测量的可行性及测量准确度。The darkness of film in X-ray nondestructive testing was typically affected by many factors,e.g.tube voltage,tube current,sample density,sample thickness,film properties,flushing conditions as well as the scattering protecting.However,the variation of darkness could be singly reflected by sample thickness through simplified design,so that the relationship between the darkness of film and sample thickness could be established.In this paper,the linear regression method was firstly employed to establish the relationship between the thickness of samples and the darkness of film.Then it was found exponential relationship satisfied the relationship better.The parameters,e.g.energy,were analyzed to understand the influence on variation of darkness of film,and lastly,it was manifested that it was feasible to measure the thickness of samples by common X-ray machine.

关 键 词：X射线 黑度 线性回归 厚度 

分 类 号：O434.1[机械工程—光学工程] O484.5[理学—光学]